Single-pixel terahertz imaging at 100 GHz frequency in active reflection mode based on mechanical spatial modulator

Document Type : Original Article

Authors

1 Researcher, Imam Hossein University, Tehran, Iran

2 Master's degree, Imam Hossein University, Tehran, Iran

3 PhD student, Sharif University of Technology, Tehran, Iran

Abstract

In this paper, a terahertz single pixel imaging method at 100 GHz frequency in reflective mode and at a distance of 4 meters from the target is presented. The source of terahertz signal generation is an impot diode that modulated the terahertz signal at a frequency of 100 GHz by a pulsed waveform. One of the important obstacles in the development of terahertz technology is easy access to radiation sources and especially detectors sensitive to terahertz waves. In the proposed imaging method, the terahertz signal is generated with a modulating pulse and radiated to the target through a lens. The return signal from the target is focused by a parabolic Cassegrain reflector, and the focused signal passes through an optical spatial modulator and finally enters a single pixel detector. The spatial light modulator or SLM, which is a mechanical mask, causes the terahertz beam to pass through different masks with its linear movement. Therefore, for each mask, we will have a different detected voltage value at the output of the single pixel detector. By using the compressive sensing algorithm, the output voltage values ​​of the detector for each mask as well as the profile of different masks passing through the path of the terahertz beam, the target image is recovered. The simulation results and comparing the results of the images recovered from the target with the real image show the success of this imaging method in reflective mode.

Keywords

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Applied Electromagnetics
Volume 12, Issue 1 - Serial Number 28
Spring and Summer
September 2024

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History

  • Receive Date: 04 April 2024
  • Revise Date: 29 May 2024
  • Accept Date: 28 June 2024
  • Publish Date: 22 July 2024

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