Design and Fabrication of Dielectric Constant Measurement Setup without Sample Holder in C band Motor

Abstract

Characterization of dielectric materials by using rectangular waveguide method usually requires a sample holder frame and a complex procedure of preparing and fixing the sample. In this paper, by removing the sample holder, the conventional waveguide method is made faster and simpler. It is shown that the conventional TRL calibration method together with NRW algorithm is able to obtain dielectric constant and loss tangent. The method is fully studied for different materials in a C band measurement setup. It is shown that for materials with lower thickness, the precision of the method up to a thickness of 0.35 λ_g (wavelength of matter under test) is acceptable. The simulation and the measurement error of a 1.5mm substrate with a dielectric constant of 3 are less than 8% and 15% respectively.

Keywords

References

   [1]      D. J. Kozakofi, “Analysis of Radome Enclosed Antennas,” Artech House, Norwood, MA, 1997.##
   [2]      S. Li, C. Akyel, and R. G. Bosisio, “Precise calculations and measurement on the complex dielectric constant of lossy materials using TM010 perturbation techniques,” IEEE Trans. Microw. Theory Tech., vol. 29, no. 10, pp. 1041–1048, Oct. 1981.##
   [3]      A. Rashidian, M. T. Aligodarz, and D. M. Klymyshyn, “Dielectric Characterization of Materials using a Modified Microstrip Ring Resonator Technique,” IEEE Trans. Dielectrics and Electrical Insulation, vol. 19, no. 4, pp. 1392–1399, Aug. 2012.##
   [4]      S. Bakhtiari, S. Ganchev, and R. Zoughi, “Open-ended rectangular waveguide for nondestructive thickness measurement variation detection of lossy dielectric slab backed by a conducting plate,” IEEE Trans. Instrum. Meas., vol. 42, no. 1, pp. 19–24, Feb. 1993.##
   [5]      S. K. Ng et al., “An Automated Microwave Waveguide Measurement Technique,” in Proc. 38th European Microwave Conf., Amsterdam, The Netherlands, pp. 1322–1325, Oct. 2008.##
   [6]      V. H. Nguyen et al., “Measurement of complex permittivity by rectangular waveguide method with simple specimen preparation,” Advanced Technologies for Communications (ATC), 2014 International Conference on. IEEE, pp. 397-400, 2014.##
   [7]      N. Chen et al., “Development of a temperature dependent dielectric constant measurement system,” IEEE 6th International Symposium on Microwave, Antenna, Propagation, & EMC Technologies (MAPE), Shanghai, China, pp. 652-655, 2015.##
   [8]      Z. Qiu, X. Li, and W. Jiang, “On stability of formulation of open-ended coaxial probe for measurement of electromagnetic properties of finite-thickness materials,” J. Electromagn. Waves Appl., vol. 23, no. 4, pp. 501-511, 2009.##
   [9]      Application Note, “Agilent Basics of Measuring the Dielectric Properties of Materials,” Agilent Literature Number 5989-2589EN, June 2006.##
 [10]      J. Krupka, “Frequency domain complex permittivity measurements at microwave frequencies,” Meas. Sci. Technol., vol. 17, no. 6, pp. R55–R70, June 2006.##
[11]       “Applying the HP 8510 TRL calibration for noncoaxial measurements,” Product Note 8510-8A, 1992.##
[12]      K. C. Yaw, “Measurement of Dielectric Material Properties,” Singapore: Rohde & Schwarz, 2012.##

Files

History

  • Receive Date: 06 November 2017
  • Revise Date: 25 February 2019
  • Accept Date: 19 September 2018
  • Publish Date: 22 October 2016

Share

How to cite

Statistics